Condensed Matter Seminars

Surface characterisation is critically important in the development and validation of advanced materials, tailored molecular structures at surfaces, sensors and screening devices, electronic structures and systems. XPS and Time of flight-Secondary Ion Mass Spectroscopy (ToF-SIMS) are core laboratory-based surface analytical techniques. Major challenges remain in creating preferably automated data interpretation tools to extract molecular information from these datasets. This presentation will discuss our approach to creating a virtual research laboratory encompassing immersive remote access to surface analysis instrumentation and beam lines at the Australian Synchrotron, instrument scheduling and secure access, data repository integration, metadata capture and data visualisation. The feasibility of integrating other national and international facilities is currently being explored.